Lee, J. (1993). In-process machine degradation monitoring and fault detection using a neural network approach. University Microfilms International.
Cita Chicago Style (17a ed.)Lee, Jay. In-process Machine Degradation Monitoring and Fault Detection Using a Neural Network Approach. Ann Arbor: University Microfilms International, 1993.
Cita MLA (9a ed.)Lee, Jay. In-process Machine Degradation Monitoring and Fault Detection Using a Neural Network Approach. University Microfilms International, 1993.
Precaución: Estas citas no son 100% exactas.