Single-Event Effects, from Space to Accelerator Environments : Analysis, Prediction and Hardening by Design

Single-Event Effects, from Space to Accelerator Environments Analysis, Prediction and Hardening by Design

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different ra...

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Detalles Bibliográficos
Autores principales: Aguiar, Ygor Quadros de. author (author), Wrobel, Frédéric. author, Autran, Jean-Luc. author, García Alía, Rubén. author
Formato: Libro electrónico
Idioma:Inglés
Publicado: Cham : Springer International Publishing 2025.
Edición:1st ed. 2025.
Materias:
Electronic circuits.
Electronic circuit design.
Aerospace engineering.
Astronautics.
Electronic Circuits and Systems.
Electronics Design and Verification.
Aerospace Technology and Astronautics.
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009860036706719
Tabla de Contenidos:
  • Radiation environments and their effects on electronics
  • Introduction to Single-Event Effects
  • Single-event effects prediction methodologies
  • Radiation Hardness Assurance (RHA) methodologies
  • Radiation hardening techniques
  • Analysis of RHBD techniques at layout level
  • Analysis of RHBD techniques at circuit level
  • Hardness improvement based on signal probability
  • Conclusions/Future Perspectives.

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