Confocal scanning optical microscopy and related imaging systems
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of t...
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Academic Press
c1996.
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| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009755199806719 |
Tabla de Contenidos:
- Front Cover; Confocal Scanning Optical Microscopy and Related Imaging Systems; Copyright Page; Contents; Preface; Chapter 1. Introduction; 1.1 Confocal and Interferometric Microscopy; 1.2 The Standard Optical Microscope; 1.3 The Confocal Microscope; 1.4 Optical Interference Microscopes; 1.5 Comparison of Scanning Optical Microscopes with Other Types of Scanning Microscopes; References; Chapter 2. Instruments; 2.1 Introduction; 2.2 The Confocal Scanning Laser Microscope; 2.3 Nipkow Disk Scanning Microscopes; 2.4 Slit Microscopes; 2.5 Confocal Transmission Microscopes
- 2.6 Alternative Imaging Configurations2.7 Interference Microscopes; 2.8 Near-Field Microscopy; 2.9 Conclusion; References; Chapter 3. Depth and Transverse Resolution; 3.1 Introduction; 3.2 Depth Response of the Confocal Microscope with Infinitesimal Pinholes and Slits; 3.3 Depth Response of the Confocal Microscope with Finite-Sized Pinholes; 3.4 Transverse Response of the Confocal Microscope; 3.5 Depth and Transverse Resolution of the Interferometric Microscope; 3.6 The Near-Field Scanning Optical Microscope (NSOM); 3.7 The Solid Immersion Microscope (SIM); 3.8 Conclusion; References
- Chapter 4. Phase Imaging4.1 Introduction; 4.2 Phase-Contrast Imaging in Conventional Microscopes; 4.3 Phase-Contrast Imaging in the CSOM; 4.4 Differential Interference Contrast Imaging; 4.5 Phase Imaging with an Interference Microscope; 4.6 Conclusion; References; Chapter 5. Applications; 5.1 Introduction; 5.2 Semiconductor Metrology; 5.3 Film Thickness Measurements; 5.4 Biological Imaging; 5.5 Conclusion; References; Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM; A.1 The Depth Response; A.2 Transverse Response; References; Index
