Machine learning for high-risk applications approaches to responsible AI

The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before...

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Detalles Bibliográficos
Otros Autores: Hall, Patrick, author (author), Curtis, James, author (writer of foreword), Pandey, Parul, author, Sudjianto, Agus, writer of foreword
Formato: Libro electrónico
Idioma:Inglés
Publicado: Sebastopol, CA : O'Reilly Media, Inc 2023.
Edición:[First edition]
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009731764006719

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