Cita APA (7a ed.)

Hennen, L., Hahn, J., Ladikas, M., Lindner, R., Peissl, W., & Est, Q. C. v. (2023). Technology assessment in a globalized world: Facing the challenges of transnational technology governance (1st ed. 2023.). Springer International Publishing.

Cita Chicago Style (17a ed.)

Hennen, Leonhard, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, y Quirinus Cornelis van Est. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. 1st ed. 2023. Cham: Springer International Publishing, 2023.

Cita MLA (9a ed.)

Hennen, Leonhard, et al. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. 1st ed. 2023. Springer International Publishing, 2023.