Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems
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Other Authors: | , |
Format: | eBook |
Language: | Inglés |
Published: |
New York :
ACM
2017.
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Series: | ACM Conferences
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Subjects: | |
See on Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009714097706719 |