Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems

Bibliographic Details
Corporate Author: International Workshop on Testing Embedded and Cyber-Physical Systems (-)
Other Authors: Yu, Tingting, editor (editor), Marinov, Darko, editor
Format: eBook
Language:Inglés
Published: New York : ACM 2017.
Series:ACM Conferences
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009714097706719

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