The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields

Patent data provide an increasingly used means to analyse innovation performance worldwide including in countries with incomplete data coverage, such as some developing countries. This paper discusses the specific issues associated with using patent data for measuring and analysing innovation in nar...

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Detalles Bibliográficos
Autor principal: Haščič, Ivan (-)
Otros Autores: Silva, Jérôme, Johnstone, Nick
Formato: Capítulo de libro electrónico
Idioma:Inglés
Publicado: Paris : OECD Publishing 2015.
Colección:OECD Science, Technology and Industry Working Papers, no.2015/05.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009704819406719

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