Scanning Probe Microscopy : Physical Property Characterization at Nanoscale

Scanning Probe Microscopy Physical Property Characterization at Nanoscale

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...

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Detalles Bibliográficos
Otros Autores: Nalladega, Vijay (Editor), Nalladega, Vijay, editor (editor)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Rijeka, Croatia : IntechOpen 2012
2012.
Materias:
Scanning transmission electron microscopy.
Electrochemistry & magnetochemistry
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009654017306719

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