Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties

Applications and metrology at nanometer scale 1 smart materials, electromagnetic waves and uncertainties

To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanic...

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Bibliographic Details
Other Authors: Dahoo, Pierre Richard, author (author), Pougnet, Philippe, author, El Hami, Abdelkhalak, author
Format: eBook
Language:Inglés
Published: Hoboken, New Jersey : London, England : John Wiley & Sons, Incorporated [2021]
Series:Mechanical engineering and solid mechanics series.
Reliability of multiphysical systems set ; v. 9.
Subjects:
Metrology.
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009645679206719
Table of Contents:
  • Nanometer Scale
  • Statistical Tools to Reduce the Effect of Design Uncertainties
  • Electromagnetic Waves and Their Applications
  • Smart Materials
  • Propagation of a Light Ray
  • References
  • Index
  • Other titles from iSTE in Mechanical Engineering and Solid Mechanics.

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