APA (7th ed.) Citation

Dahoo, P. R., Pougnet, P., & El Hami, A. (2021). Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties. John Wiley & Sons, Incorporated.

Chicago Style (17th ed.) Citation

Dahoo, Pierre Richard, Philippe Pougnet, and Abdelkhalak El Hami. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Hoboken, New Jersey : London, England: John Wiley & Sons, Incorporated, 2021.

MLA (9th ed.) Citation

Dahoo, Pierre Richard, et al. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. John Wiley & Sons, Incorporated, 2021.