X-ray diffraction modern experimental techniques

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Detalles Bibliográficos
Otros Autores: Seeck, Oliver H., editor (editor)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Boca Raton, Florida : Pan Stanford Publishing 2014.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009633637906719
Tabla de Contenidos:
  • Front Cover; Contents; Contents; Preface; Preface; Chapter 1 Overview of X- Ray Scattering and Diffraction Theory and Techniques; Chapter 2 Scattering and Diffraction Beamlines at Synchrotron Radiation Sources; Chapter 3 Micro- and Nanodiffraction; Chapter 4 Small- Angle X- Ray Scattering; Chapter 5 The X- Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity; Chapter 6 Inelastic X- Ray Scattering from Phonons; Chapter 7 Magnetic X- Ray Scattering; Chapter 8 Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism
  • Chapter 9 Reflectivity at Liquid InterfacesChapter 10 X- Ray Diffraction at Extreme Conditions: Today and Tomorrow; Chapter 11 Synchrotron Tomography; Chapter 12 Coherent X- Ray Diffraction Imaging of Nanostructures; Chapter 13 X- Ray Photon Correlation Spectroscopy; Back Cover