X-ray diffraction modern experimental techniques

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Detalles Bibliográficos
Otros Autores: Seeck, Oliver H., editor (editor)
Formato: Libro electrónico
Idioma:Inglés
Publicado: Boca Raton, Florida : Pan Stanford Publishing 2014.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009633637906719

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