X-ray diffraction modern experimental techniques

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Bibliographic Details
Other Authors: Seeck, Oliver H., editor (editor)
Format: eBook
Language:Inglés
Published: Boca Raton, Florida : Pan Stanford Publishing 2014.
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009633637906719
Description
Summary:High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electr
Item Description:Description based upon print version of record.
Physical Description:1 online resource (438 p.)
Bibliography:Includes bibliographical references at the end of each chapters.
ISBN:9780429071898
9789814303590