Reliability, maintainability and risk practical methods for engineers
Reliability, Maintainability and Risk: Practical Methods for Engineers, Ninth Edition, has taught reliability and safety engineers techniques to minimize process design, operation defects, and failures for 35 years. For beginners, the book provides tactics on how to avoid pitfalls in this complex an...
Otros Autores: | |
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Formato: | Libro electrónico |
Idioma: | Inglés |
Publicado: |
Oxford, England :
Butterworth-Heinemann
2017.
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Edición: | Ninth edition |
Materias: | |
Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009630325406719 |
Tabla de Contenidos:
- Cover
- Title page
- Copyright page
- Contents
- Preface
- Acknowledgements
- Part 1 - Understanding Reliability Parameters and Costs
- Chapter 1 - The History of Reliability and Safety Technology
- 1.1 - Failure Data
- 1.2 - Hazardous Failures
- 1.3 - Predicting Reliability and Risk
- 1.4 - Achieving Reliability and Safety-Integrity
- 1.5 - The RAMS-Cycle
- 1.6 - Contractual and Legal Pressures
- 1.7 - Reliability versus Functional Safety
- Chapter 2 - Understanding Terms and Jargon
- 2.1 - Defining Failure and Failure Modes
- 2.2 - Failure Rate and Mean Time Between Failures
- 2.2.1 - The Observed Failure Rate
- 2.2.2 - The Observed Mean Time Between Failures
- 2.2.3 - The Observed Mean Time to Fail
- 2.2.4 - Mean Life
- 2.3 - Interrelationships of Terms
- 2.3.1 - Reliability and Failure Rate
- 2.3.2 - Reliability and Failure Rate as an Approximation
- 2.3.3 - Reliability and MTBF
- 2.4 - The Bathtub Distribution
- 2.5 - Down Time and Repair Time
- 2.6 - Availability, Unavailability and Probability of Failure on Demand
- 2.7 - Hazard and Risk-Related Terms
- 2.8 - Choosing the Appropriate Parameter
- Chapter 3 - A Cost-Effective Approach to Quality, Reliability and Safety
- 3.1 - Reliability and Optimum Cost
- 3.2 - Costs and Safety
- 3.2.1 - The Need for Optimization
- 3.2.2 - Costs and Savings Involved with Safety Engineering
- 3.3 - The Cost of Quality
- Prevention Costs
- Appraisal Costs
- Failure Costs
- Part 2 - Interpreting Failure Rates
- Chapter 4 - Realistic Failure Rates and Prediction Confidence
- 4.1 - Data Accuracy
- 4.2 - Sources of Data
- 4.2.1 - Electronic Failure Rates
- 4.2.1.1 - US Military Handbook 217 (generic, no failure modes)
- 4.2.1.2 - HRD5 Handbook of Reliability Data for Electronic Components used in Telecommunications Systems (industry specific.
- 4.2.1.3 - Recueil de Donnés de Fiabilité du CNET (industry specific, no failure modes)
- 4.2.1.4 - Bellcore (Reliability Prediction Procedure for Electronic Equipment) TR-NWT-000332 Issue 5 1995 (industry specifi...
- 4.2.1.5 - Electronic Data NOT Available for Purchase
- 4.2.2 - Other General Data Collections
- 4.2.2.1 - Non-Electronic Parts Reliability Data Book - NPRD (generic, some failure modes)
- 4.2.2.2 - OREDA - Offshore Reliability Data (industry specific, detailed failure modes, mean times to repair)
- 4.2.2.3 - TECHNIS (the author) (industry and generic, many failure modes, some repair times)
- 4.2.2.4 - UKAEA (industry and generic, many failure modes)
- 4.2.2.5 - Sources of Nuclear Generation Data (industry specific)
- 4.2.2.6 - US Sources of Power Generation Data (industry specific)
- 4.2.2.7 - SINTEF (industry specific)
- 4.2.2.8 - Data NOT Available for Purchase
- 4.2.3 - Some Older Sources
- 4.3 - Data Ranges
- 4.3.1 - Using the Ranges
- 4.4 - Confidence Limits of Prediction
- 4.5 - Manufacturers' Data (Warranty Claims)
- 4.6 - Overall Conclusions
- Chapter 5 - Interpreting Data and Demonstrating Reliability
- 5.1 - The Four Cases
- 5.2 - Inference and Confidence Levels
- 5.3 - The Chi-Square Test
- 5.4 - Understanding the Method in More Detail
- 5.5 - Double-Sided Confidence Limits
- 5.6 - Reliability Demonstration
- 5.7 - Sequential Testing
- 5.8 - Setting Up Demonstration Tests
- Chapter 6 - Variable Failure Rates and Probability Plotting
- 6.1 - The Weibull Distribution
- 6.2 - Using the Weibull Method
- 6.2.1 - Curve Fitting to Interpret Failure Data
- 6.2.2 - Manual Plotting
- 6.2.3 - Using the COMPARE Computer Tool
- 6.2.4 - Significance of the Result
- 6.2.5 - Optimum Preventive Replacement
- 6.3 - More Complex Cases of the Weibull Distribution
- 6.4 - Continuous Processes.
- Part 3 - Predicting Reliability and Risk
- Chapter 7 - Basic Reliability Prediction Theory
- 7.1 - Why Predict RAMS?
- 7.2 - Probability Theory
- 7.2.1 - The Multiplication Rule
- 7.2.2 - The Addition Rule
- 7.2.3 - The Binomial Theorem
- 7.2.4 - Bayes Theorem
- 7.3 - Reliability of Series Systems
- 7.4 - Redundancy Rules
- 7.4.1 - General Types of Redundant Configuration
- 7.4.2 - Full Active Redundancy (Without Repair)
- 7.4.3 - Partial Active Redundancy (Without Repair)
- 7.4.4 - Conditional Active Redundancy
- 7.4.5 - Standby Redundancy
- 7.4.6 - Load Sharing
- 7.5 - General Features of Redundancy
- 7.5.1 - Incremental Improvement
- 7.5.2 - Further Comparisons of Redundancy
- 7.5.3 - Redundancy and Cost
- Exercises
- Chapter 8 - Methods of Modeling
- 8.1 - Block Diagrams and Repairable Systems
- 8.1.1 - Reliability Block Diagrams
- 8.1.1.1 - Establish failure criteria
- 8.1.1.2 - Create a reliability block diagram
- 8.1.1.3 - Failure mode analysis
- 8.1.1.4 - Calculation of system reliability
- 8.1.1.5 - Reliability allocation
- 8.1.2 - Repairable Systems (Revealed Failures)
- 8.1.3 - Repairable Systems (Unrevealed Failures)
- 8.1.4 - Systems With Cold Standby Units and Repair
- 8.1.5 - Modeling Repairable Systems with Both Revealed and Unrevealed Failures
- 8.1.6 - Allowing for imperfect proof tests
- 8.1.7 - Conventions for Labeling 'Dangerous', 'Safe', Revealed and Unrevealed Failures
- 8.2 - Common Cause (Dependent) Failure
- 8.2.1 - What is CCF?
- 8.2.2 - Types of CCF Model
- 8.2.3 - The BETAPLUS Model
- 8.2.3.1 - Checklists and scoring of the (A) and (B) factors in the model
- 8.2.3.2 - Assessment of the diagnostic interval factor (C)
- 8.2.3.3 - 'M out of N' redundancy/voting
- 'one out of six' voting
- 'five out of six' voting
- 8.3 - Fault Tree Analysis
- 8.3.1 - The Fault Tree.
- 8.3.2 - Calculations
- 8.3.3 - Cutsets
- 8.3.4 - Computer Tools
- 8.3.5 - Allowing for Common Cause Failure
- 8.3.6 - Fault Tree Analysis in Design
- 8.3.7 - A Cautionary Note (Illogical Trees)
- 8.4 - Event Tree Diagrams
- 8.4.1 - Why Use Event Trees?
- 8.4.2 - The Event Tree Model
- 8.4.3 - Quantification
- 8.4.4 - Differences
- 8.4.5 - Feedback Loops
- Chapter 9 - Quantifying the Reliability Models
- 9.1 - The Reliability Prediction Method
- 9.2 - Allowing for Diagnostic Intervals
- 9.2.1 - Establishing Diagnostic Coverage
- 9.2.2 - Modelling Diagnostic Coverage
- 9.2.3 - Partial Stroke Testing
- 9.2.4 - Safe Failure Fraction
- 9.3 - FMEDA (Failure Mode and Diagnostic Analysis)
- 9.4 - Human Factors
- 9.4.1 - Background
- 9.4.2 - Models
- 9.4.3 - HEART (Human Error Assessment and Reduction Technique)
- 9.4.4 - THERP (Technique for Human Error Rate Prediction)
- 9.4.5 - TESEO (Empirical Technique to Estimate Operator Errors)
- 9.4.6 - Other Methods
- 9.4.7 - Human Error Probabilities
- 9.4.8 - Trends in Rigor of Assessment
- 9.5 - Simulation
- 9.5.1 - The Technique
- 9.5.2 - Some Packages
- 9.5.2.1 - Optagon
- 9.5.2.2 - MAROS, TARO and TRAIL
- 9.5.2.3 - RAM4, RAMP and SAM
- 9.5.2.3.1 - RAM4
- 9.5.2.3.2 - RAMP
- 9.5.2.3.3 - SAM
- 9.5.2.4 - ITEM ToolKit
- 9.6 - Comparing Predictions with Targets
- Chapter 10 - Risk Assessment (QRA)
- 10.1 - Frequency and Consequence
- 10.2 - Perception of Risk, ALARP and Cost per Life Saved
- 10.2.1 - Maximum Tolerable Risk (Individual Risk)
- 10.2.2 - Maximum Tolerable Failure Rate
- 10.2.3 - ALARP and Cost Per Life Saved
- 10.2.4 - Societal Risk
- 10.2.5 - Production/Damage Loss
- 10.2.6 - Environmental Loss
- 10.3 - Hazard Identification
- 10.3.1 - HAZOP
- 10.3.2 - HAZID
- 10.3.3 - HAZAN (Consequence Analysis)
- 10.4 - Factors to Quantify
- 10.4.1 - Reliability.
- 10.4.2 - Lightning and Thunderstorms
- 10.4.3 - Aircraft Impact
- 10.4.3.1 - Background
- 10.4.3.2 - Airfield Proximity
- 10.4.4 - Earthquake
- 10.4.5 - Meteorological Factors
- 10.4.6 - Other Consequences
- Part 4 - Achieving Reliability and Maintainability
- Chapter 11 - Design and Assurance Techniques
- 11.1 - Specifying and Allocating the Requirement
- 11.2 - Stress Analysis
- 11.3 - Environmental Stress Protection
- 11.4 - Failure Mechanisms
- 11.4.1 - Types of Failure Mechanism
- 11.4.2 - Failures in Semiconductor Components
- 11.4.3 - Discrete Components
- 11.5 - Complexity and Parts
- 11.5.1 - Reduction of Complexity
- 11.5.2 - Part Selection
- 11.5.3 - Redundancy
- 11.6 - Burn-In and Screening
- 11.7 - Maintenance Strategies
- Chapter 12 - Design Review, Test and Reliability Growth
- 12.1 - Review Techniques
- 12.2 - Categories of Testing
- 12.2.1 - Environmental Testing
- 12.2.2 - Marginal Testing
- 12.2.3 - High-Reliability Testing
- 12.2.4 - Testing for Packaging and Transport
- 12.2.5 - Multiparameter Testing
- 12.2.6 - Step-Stress Testing
- 12.3 - Reliability Growth Modeling
- 12.3.1 - The CUSUM Technique
- 12.3.2 - Duane Plots
- Chapter 13 - Field Data Collection and Feedback
- 13.1 - Reasons for Data Collection
- 13.2 - Information and Difficulties
- 13.3 - Times to Failure
- 13.4 - Spreadsheets and Databases
- Equipment code
- How found
- Type of fault
- Action taken
- Discipline
- Free text
- 13.5 - Best Practice and Recommendations
- 13.6 - Analysis and Presentation of Results
- 13.7 - Manufacturers' data
- 13.8 - Anecdotal Data
- 13.9 - Examples of Failure Report Forms
- 13.10 - No-Fault-Found (NFF)
- Chapter 14 - Factors Influencing Down Time
- 14.1 - Key Design Areas
- 14.1.1 - Access
- 14.1.2 - Adjustment
- 14.1.3 - Built-In Test Equipment.
- 14.1.4 - Circuit Layout and Hardware Partitioning.