Ionizing radiation effects in electronics from memories to imagers

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important...

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Detalles Bibliográficos
Otros Autores: Bagatin, Marta, editor (editor), Gerardin, Simone, editor, Iniewski, Krzysztof, 1960- editor
Formato: Libro electrónico
Idioma:Inglés
Publicado: Boca Raton ; London : CRC Press [2016]
Edición:1st edition
Colección:Devices, circuits, and systems.
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009630006106719
Tabla de Contenidos:
  • Front Cover; Contents; Preface; Editors; Contributors; Chapter 1: Introduction to the Effects of Radiation on Electronic Devices; Chapter 2: Monte Carlo Simulation of Radiation Effects; Chapter 3: A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies; Chapter 4: Radiation Effects in DRAMs; Chapter 5: Radiation Effects in Flash Memories; Chapter 6: Microprocessor Radiation Effects; Chapter 7: Soft-Error Hardened Latch and Flip-Flop Design; Chapter 8: Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs
  • Chapter 9: Single-Event Mitigation Techniques for Analog and Mixed-Signal CircuitsChapter 10: CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics : TID Effects and Bulk Damage Study; Chapter 11: Radiation Effects on CMOS Active Pixel Image Sensors; Chapter 12: Natural Radiation Effects in CCD Devices; Chapter 13: Radiation Effects on Optical Fibers and Fiber-Based Sensors; Back Cover