Reliability and failure of electronic materials and devices

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

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Detalles Bibliográficos
Otros Autores: Ohring, Milton, 1936- author (author), Kasprzak, Lucian, author
Formato: Libro electrónico
Idioma:Inglés
Publicado: Amsterdam ; Boston : Academic Press is an imprint of Elsevier [2015]
Edición:2nd ed
Materias:
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009629432006719

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