Cita APA (7a ed.)

Ohring, M., & Kasprzak, L. (2015). Reliability and failure of electronic materials and devices (2nd ed.). Academic Press is an imprint of Elsevier.

Cita Chicago Style (17a ed.)

Ohring, Milton, y Lucian Kasprzak. Reliability and Failure of Electronic Materials and Devices. 2nd ed. Amsterdam ; Boston: Academic Press is an imprint of Elsevier, 2015.

Cita MLA (9a ed.)

Ohring, Milton, y Lucian Kasprzak. Reliability and Failure of Electronic Materials and Devices. 2nd ed. Academic Press is an imprint of Elsevier, 2015.