Thoughtful machine learning : a test-driven approach

Thoughtful machine learning a test-driven approach

Learn how to apply test-driven development (TDD) to machine-learning algorithms—and catch mistakes that could sink your analysis. In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algo...

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Detalles Bibliográficos
Otros Autores: Kirk, Matthew (Data scientist) author (author), Loukides, Michael Kosta, editor (editor), Spencer, Ann, editor (cover designer), Yarbrough, Melanie, editor, Monaghan, Rachel, editor, Volkhausen, Ellie, cover designer
Formato: Libro electrónico
Idioma:Inglés
Publicado: Sebastopol, California : O'Reilly 2014.
2015.
Edición:1st edition
Materias:
Computer algorithms.
Ver en Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009629196706719

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