Soft errors from particles to circuits
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practi...
| Other Authors: | , , |
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| Format: | eBook |
| Language: | Inglés |
| Published: |
Boca Raton, Florida :
CRC Press
[2015]
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| Edition: | 1st edition |
| Series: | Devices, circuits, and systems.
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| Subjects: | |
| See on Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009628877606719 |
Table of Contents:
- Front Cover; Contents; Foreword; Preface; Acknowledgments; Authors; Introduction; Glossary; Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing
- Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices; Back Cover
