APA (7th ed.) Citation

Goel, S. K., & Chakrabarty, K. (2014). Testing for small-delay defects in nanoscale CMOS integrated circuits (1st edition.). CRC Press.

Chicago Style (17th ed.) Citation

Goel, Sandeep K., and Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. 1st edition. Boca Raton: CRC Press, 2014.

MLA (9th ed.) Citation

Goel, Sandeep K., and Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. 1st edition. CRC Press, 2014.