Transmission electron microscopy in micro-nanoelectronics

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in indust...

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Bibliographic Details
Other Authors: Claverie, A. (Alain) (-)
Format: eBook
Language:Inglés
Published: Hoboken, N.J. : London : John Wiley &Sons, Inc., ; ISTE 2013.
Edition:1st edition
Series:Nanoscience and nanotechnology series.
Subjects:
See on Biblioteca Universitat Ramon Llull:https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009628496606719

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