Semiconductor x-ray detectors
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
| Otros Autores: | , |
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| Formato: | Libro electrónico |
| Idioma: | Inglés |
| Publicado: |
Boca Raton, FL :
CRC Press
[2014].
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| Edición: | 1st edition |
| Colección: | Sensors series.
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| Materias: | |
| Ver en Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991009628494106719 |
Tabla de Contenidos:
- Front Cover; Contents; Preface; Acknowledgments; Authors; Acronyms; Chapter 1: Introduction; Chapter 2: Detector Response Function; Chapter 3: Detector Artefacts; Chapter 4: Contacts; Chapter 5: Si(Li) X-Ray Detectors; Chapter 6: HPSi and HPGe X-Ray Detectors; Chapter 7: X-Ray Detectors Based on Silicon Lithography and Planar Technology; Chapter 8: CCD-Based X-Ray Detectors; Chapter 9: Silicon Drift X-Ray Detectors; Chapter 10: Wide Bandgap Semiconductors; Chapter 11: History of Semiconductor X-Ray Detectors and Their Applications; Back Cover
