Built-in test for VLSI pseudorandom techniques
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | Inglés |
| Published: |
New York :
Wiley
cop. 1987
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| Subjects: | |
| See on Biblioteca Universitat Ramon Llull: | https://discovery.url.edu/permalink/34CSUC_URL/1im36ta/alma991007608969706719 |
| Item Description: | "A Wiley-Interscience publication." |
|---|---|
| Physical Description: | XIII, 354 p. : il. ; 24 cm |
| Bibliography: | Bibliografia. Índex |
| ISBN: | 9780471624639 |
