Cita APA (7a ed.)

Bardell, P. H., McAnney, W. H., & Savir, J. (1987). Built-in test for VLSI: Pseudorandom techniques. Wiley.

Cita Chicago Style (17a ed.)

Bardell, Paul H., William H. McAnney, y Jacob Savir. Built-in Test for VLSI: Pseudorandom Techniques. New York: Wiley, 1987.

Cita MLA (9a ed.)

Bardell, Paul H., et al. Built-in Test for VLSI: Pseudorandom Techniques. Wiley, 1987.