Vickerman, J. C., & Briggs, D. (2001). ToF-SIMS: Surface analysis by mass spectrometry. IM : SurfaceSpectra.
Chicago Style (17th ed.) CitationVickerman, J. C., and D. Briggs. ToF-SIMS: Surface Analysis by Mass Spectrometry. Chichester: IM : SurfaceSpectra, 2001.
MLA (9th ed.) CitationVickerman, J. C., and D. Briggs. ToF-SIMS: Surface Analysis by Mass Spectrometry. IM : SurfaceSpectra, 2001.
Warning: These citations may not always be 100% accurate.