CMOS circuit Coulomb interaction DC and AC characteristic fluctuations History of engineering & technology III-V Integration Kubo–Greenwood formalism MOSFETs Monte Carlo Padé approximants Richardson extrapolation Schrödinger based quantum corrections TASE ZnO aspect ratio of channel cross-section charge transport conduction mechanism constriction device simulation dimensionality reduction drift-diffusion electron–phonon interaction fabrication field effect transistor gate-all-around geometric correlations heat equation hot electrons lowest order approximation material properties